Characterisation of multilayers by X-ray reflection
Journal Article
(1998)
Author(s)
AJ Steinfort (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)
PMLO Scholte (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)
Fokke Tuinstra (TU Delft - Old - sect Physics Education (TN/WNO))
Department
Old organisation TN/TechnischeNatuurkunde voorm
To reference this document use:
https://resolver.tudelft.nl/uuid:0028a3db-5223-4583-8c47-5641b420762f
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Publication Year
1998
Department
Old organisation TN/TechnischeNatuurkunde voorm
Volume number
409
Pages (from-to)
229-240
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