Resonant Absorption Effects in the diffraction of low energy electrons.

Resonant Absorption Effects in the diffraction of low energy electrons.

Characterisation of multilayers by X-ray reflection

De ontwikkeling van programmatuur voor CFD berekeningen aan chemische reactoren. Verslag periode 3: december 1997 t/m mei 1998.

Growth pyramids on Si(111) facets: a CVD and MBE study

Room temperature growth of submonolayers of silicon on Si(001) studied with STM

Sodim-doped dimer rows on SI(001)

Physical and crystallographic properties of alkali antimonides

Sodium doped dimer rows on Si(001)

Nucleation of homoepitaxial Si chains on Si(001) at room temperature

Atomic details of step flow growth on Si(001)

Report on de X-ray data of SION material

Interactions between adsorbed Si dimers on Si(001)

Nucleation of a complex oxide during epitaxial film growth: SmBa2Cu3Oy on SrTiO3

Strain structures in nanoscale germanium hut clusters on Si(001) studied by X-ray diffraction

The internal strain structure of Ge hut clusters on Si(001), studied by X-ray diffraction

New application of classical x-ray diffraction methods for epitaxial film characterization

A calibrated scanning tunneling microscope equipped with capacitive sensors

AFM study of (100) SrTiO3 substrates used to grow high-Tc-superconductor thin films

Origin of rippled structures formed during growth of Si on Si(001) with MBE