FT

Fokke Tuinstra

View Pure Profile

Authored

20 records found

Resonant Absorption Effects in the diffraction of low energy electrons.
Journal article - ARHF Ettema, A Mans, F. Tuinstra

Resonant Absorption Effects in the diffraction of low energy electrons.
Journal article - ARHF Ettema, A Mans, F. Tuinstra

Origin of rippled structures formed during growth of Si on Si(001) with MBE

New application of classical x-ray diffraction methods for epitaxial film characterization

Growth pyramids on Si(111) facets: a CVD and MBE study

Interactions between adsorbed Si dimers on Si(001)

Atomic details of step flow growth on Si(001)

Report on de X-ray data of SION material

Characterisation of multilayers by X-ray reflection
Journal article - AJ Steinfort, PMLO Scholte, F. Tuinstra

Physical and crystallographic properties of alkali antimonides

Room temperature growth of submonolayers of silicon on Si(001) studied with STM

Nucleation of homoepitaxial Si chains on Si(001) at room temperature

Strain structures in nanoscale germanium hut clusters on Si(001) studied by X-ray diffraction

Nucleation of a complex oxide during epitaxial film growth: SmBa2Cu3Oy on SrTiO3

A calibrated scanning tunneling microscope equipped with capacitive sensors

Sodium doped dimer rows on Si(001)

AFM study of (100) SrTiO3 substrates used to grow high-Tc-superconductor thin films

The internal strain structure of Ge hut clusters on Si(001), studied by X-ray diffraction

De ontwikkeling van programmatuur voor CFD berekeningen aan chemische reactoren. Verslag periode 3: december 1997 t/m mei 1998.

Sodim-doped dimer rows on SI(001)