Resonant Absorption Effects in the diffraction of low energy electrons.

Resonant Absorption Effects in the diffraction of low energy electrons.

De ontwikkeling van programmatuur voor CFD berekeningen aan chemische reactoren. Verslag periode 3: december 1997 t/m mei 1998.

Characterisation of multilayers by X-ray reflection

Growth pyramids on Si(111) facets: a CVD and MBE study

Nucleation of homoepitaxial Si chains on Si(001) at room temperature

Room temperature growth of submonolayers of silicon on Si(001) studied with STM

Sodium doped dimer rows on Si(001)

Sodim-doped dimer rows on SI(001)

Report on de X-ray data of SION material

Atomic details of step flow growth on Si(001)

Physical and crystallographic properties of alkali antimonides

A calibrated scanning tunneling microscope equipped with capacitive sensors

Strain structures in nanoscale germanium hut clusters on Si(001) studied by X-ray diffraction

Nucleation of a complex oxide during epitaxial film growth: SmBa2Cu3Oy on SrTiO3

New application of classical x-ray diffraction methods for epitaxial film characterization

Origin of rippled structures formed during growth of Si on Si(001) with MBE

AFM study of (100) SrTiO3 substrates used to grow high-Tc-superconductor thin films

Interactions between adsorbed Si dimers on Si(001)

The internal strain structure of Ge hut clusters on Si(001), studied by X-ray diffraction