Gert Rietveld
18 records found
1
Authored
Closed-form solutions are presented for calculating the reflection coefficient with corresponding uncertainty of metrology-grade 3.5 mm air-dielectric coaxial transmission lines for use as reference standards in S-parameter measurements up to 33 GHz. The closed-form solutions ...
A method is presented for automated probing of on-wafer devices for measurements at millimetre-wave frequencies. The proposed method automatically detects the contact between the measurement probe and on-wafer device, based on the evaluation of variation in the input reflectio ...
This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how the VNA measurement noise performance is enhanced through implementation of a high-speed, broadband, active ...
Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used ...