A Novel Calibration Method for Active Interferometer-Based VNAs

Journal article (2020)

Authors

F.A. Mubarak National Metrology Institute VSL
R. Romano Vertigo Technologies
G Rietveld National Metrology Institute VSL
M. Spirito Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
Noise Measurement Calibration Nanostructures Traceability Impedance mismatch Vector network analyzer (VNA) Microwave interferometry Nanoelectronics Extreme impedance measurement
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Published Date

2020

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics

Abstract

The addition of RF interferometers to vector network analyzer (VNA) test benches has allowed for realization of low-noise high-frequency measurements of extreme impedance devices. However, when employing correction techniques such as the short-open-load method, the RF response of the interferometer hardware introduces measurement inaccuracies due to unwanted load-dependent inconsistencies. This letter presents a novel VNA calibration method that enables both low-noise and accurate small-signal characterization of highly mismatched devices. The proposed solution is experimentally validated in the 10-18-GHz band, confirming a 23-fold improvement in measurement resolution with absolute accuracy across the entire Γ range of the VNA. The accuracy of the new calibration process is verified via comparison with traceable reference standards supported by state-of-the-art uncertainties.

Files

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