A calibrated scanning tunneling microscope equipped with capacitive sensors

Journal article (1996)

Authors

AE Holman External organisation
CD Laman Old - sect Electronic Materials (NS/EM)
PMLO Scholte Old organisation TN/TechnischeNatuurkunde voorm
WC Heerens ImPhys/Charged Particle Optics
F. Tuinstra Old - sect Physics Education (TN/WNO)
Research Group
Old - sect Electronic Materials (NS/EM)
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Published Date

1996

Language

Undefined/Unknown

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Research Group

Old - sect Electronic Materials (NS/EM)