A calibrated scanning tunneling microscope equipped with capacitive sensors

Journal Article (1996)
Author(s)

AE Holman (External organisation)

CD Laman (TU Delft - Old - sect Electronic Materials (NS/EM))

PMLO Scholte (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)

WC Heerens (TU Delft - ImPhys/Charged Particle Optics)

Fokke Tuinstra (TU Delft - Old - sect Physics Education (TN/WNO))

Research Group
Old - sect Electronic Materials (NS/EM)
More Info
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Publication Year
1996
Research Group
Old - sect Electronic Materials (NS/EM)
Issue number
6
Volume number
67
Pages (from-to)
2274-2280

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