A calibrated scanning tunneling microscope equipped with capacitive sensors
Journal Article
(1996)
Author(s)
AE Holman (External organisation)
CD Laman (TU Delft - Old - sect Electronic Materials (NS/EM))
PMLO Scholte (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)
WC Heerens (TU Delft - ImPhys/Charged Particle Optics)
Fokke Tuinstra (TU Delft - Old - sect Physics Education (TN/WNO))
Research Group
Old - sect Electronic Materials (NS/EM)
To reference this document use:
https://resolver.tudelft.nl/uuid:055a1685-e5dc-4b2c-bbc9-79c830979a3e
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Publication Year
1996
Research Group
Old - sect Electronic Materials (NS/EM)
Issue number
6
Volume number
67
Pages (from-to)
2274-2280
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