DotFETs: MOSFETs strained by a single SiGe dot in a low-temperature ELA technology

Biasotto, C

DotFETs: MOSFETs strained by a single SiGe dot in a low-temperature ELA technology

Doctoral thesis (2011)

Authors

C Biasotto Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2011

Language

English

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Research Group

Electronic Components, Technology and Materials

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