Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy

Journal article (2013)

Authors

J.F. Creemer Electronic Components, Technology and Materials - EEMCS
B. Morana Electronic Components, Technology and Materials - EEMCS
L. Mele Electronic Components, Technology and Materials - EEMCS
P Dona External organisation
BJ Nelissen. External organisation
S Helveg External organisation
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Published Date

2013

Language

English

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