Towards an effective utilization of partially defected interconnections in 2D mesh NoCs
Conference Paper
(2014)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/ISVLSI.2014.70
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https://resolver.tudelft.nl/uuid:088275a5-cf98-4b89-8b81-a6f60bc9dc76
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Publication Year
2014
Language
English
Research Group
Computer Engineering
Pages (from-to)
492-497
ISBN (print)
978-1-4799-3763-9
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