The Tynode

A new vacuum electron multiplier

Journal Article (2017)
Author(s)

Harry van der Graaf (TU Delft - Applied Sciences, Nikhef)

Hassan Akhtar

Neil Budko (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Hong Wah Chan (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Cornelis W. Hagen (TU Delft - ImPhys/Charged Particle Optics)

Conny C.T. Hansson (Nikhef, TU Delft - ImPhys/Charged Particle Optics)

Gert Nützel (Photonis)

Sergio D. Pinto (Photonis)

Violeta Prodanović (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Behrouz Raftari

Pasqualina M. Sarro (TU Delft - Electrical Engineering, Mathematics and Computer Science)

John Sinsheimer (Brookhaven National Laboratory)

John Smedley (Brookhaven National Laboratory)

Shuxia Tao (Eindhoven University of Technology)

Anne M.M.G. Theulings (TU Delft - Applied Sciences, Nikhef)

Kees Vuik (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group
RST/Neutron and Photon Methods for Materials
DOI related publication
https://doi.org/10.1016/j.nima.2016.11.064 Final published version
More Info
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Publication Year
2017
Language
English
Research Group
RST/Neutron and Photon Methods for Materials
Volume number
847
Pages (from-to)
148-161
Downloads counter
361

Abstract

By placing, in vacuum, a stack of transmission dynodes (tynodes) on top of a CMOS pixel chip, a single free electron detector could be made with outstanding performance in terms of spatial and time resolution. The essential object is the tynode: an ultra thin membrane, which emits, at the impact of an energetic electron on one side, a multiple of electrons at the other side. The electron yields of tynodes have been calculated by means of GEANT-4 Monte Carlo simulations, applying special low-energy extensions. The results are in line with another simulation based on a continuous charge-diffusion model. By means of Micro Electro Mechanical System (MEMS) technology, tynodes and test samples have been realized. The secondary electron yield of several samples has been measured in three different setups. Finally, several possibilities to improve the yield are presented.