4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation

Conference Paper (2011)
Author(s)

J. Tan (TU Delft - Electronic Instrumentation)

B Buettgen (External organisation)

Albert Theuwissen (TU Delft - Electronic Instrumentation)

Research Group
Electronic Instrumentation
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Publication Year
2011
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
228-231

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