Radiation effects on CMOS image sensors due to X-rays
Conference Paper
(2010)
Author(s)
J. Tan (TU Delft - Electronic Instrumentation)
B Buttgen (TU Delft - Electronic Instrumentation)
Albert Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:0e37f672-fc81-49f9-8c2d-9486b14645b3
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Publication Year
2010
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
279-283
ISBN (print)
978-1-4244-8575-8
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