Multi-physics simulation and reliability analysis for LED luminaires under step stress accelerated degradation test
Conference Paper
(2012)
Author(s)
H Tang (External organisation)
DG Yang (External organisation)
Gouqi Zhang (TU Delft - Electronic Components, Technology and Materials)
F Hou (External organisation)
M Cai (External organisation)
Z Cui (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/ESimE.2012.6191774
To reference this document use:
https://resolver.tudelft.nl/uuid:0e79b6fc-27a4-4b8d-ba4f-2827702290fe
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
491-495
ISBN (print)
978-1-4673-1512-8
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