Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure

Journal article (2001)

Authors

M. Hajian Microwave Technology and Systems for Radar
SH Heijnen Microwave Technology and Systems for Radar
FH Groen Old - sect Physics Education (TN/WNO)
P Hakkert External organisation
L.P. Ligthart Microwave Technology and Systems for Radar
Research Group
Microwave Technology and Systems for Radar
More Info
expand_more

Published Date

2001

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Microwave Technology and Systems for Radar