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P Hakkert
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2 records found
Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure
Journal article -
M. Hajian
,
SH Heijnen
,
FH Groen
,
P Hakkert
,
L.P. Ligthart
Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure.
Journal article -
M Hajian
,
SH Heijnen
,
FH Groen
,
P Hakkert
,
L.P. Ligthart