Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure.

Journal article (2001)

Authors

M Hajian External organisation
SH Heijnen External organisation
FH Groen ImPhys/Optics - AS
P Hakkert External organisation
L.P. Ligthart Microwave Technology and Systems for Radar
Research Group
ImPhys/Optics (AS) (TU Delft)
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Published Date

2001

Language

Undefined/Unknown

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Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Optics