Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure.
Journal Article
(2001)
Author(s)
M Hajian (External organisation)
SH Heijnen (External organisation)
FH Groen (TU Delft - ImPhys/Optics)
P Hakkert (External organisation)
Leo Ligthart (TU Delft - Microwave Technology and Systems for Radar)
Research Group
ImPhys/Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:5a770112-e46c-4d01-abf5-3d2be7c2de19
More Info
expand_more
expand_more
Publication Year
2001
Research Group
ImPhys/Optics
Issue number
5
Volume number
31
Pages (from-to)
349-353
No files available
Metadata only record. There are no files for this record.