Digital Image Sensor Evolution and New Frontiers
Eric R. Fossum (Thayer School of Engineering at Dartmouth)
Nobukazu Teranishi (Shizuoka University)
Albert J.P. Theuwissen (Harvest Imaging, Belgium, TU Delft - Electrical Engineering, Mathematics and Computer Science)
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Abstract
This article reviews nearly 60 years of solid-state image sensor evolution and identifies potential new frontiers in the field. From early work in the 1960s, through the development of charge-coupled device image sensors, to the complementary metal oxide semiconductor image sensors now ubiquitous in our lives, we discuss highlights in the evolutionary chain. New frontiers, such as 3D stacked technology, photon-counting technology, and others, are briefly discussed.
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