Interfacial Corrosion Behavior Analysis of Sintered Silver and Sintered Copper Joints for Power Electronics Packaging

Conference Paper (2026)
Author(s)

Letao Bian (Fudan University)

Xinyue Wang (Fudan University)

Jing Zhang (Heraeus Materials Technology Shanghai Ltd.)

Jianhao Wang (Heraeus Materials Technology Shanghai Ltd.)

G.Q. Zhang (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Kim S. Siow (Universiti Kebangsaan Malaysia)

Pan Liu (Research Institute of Fudan University, Ningbo, Fudan University)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.23919/ICEP-HBS69241.2026.11550520 Final published version
More Info
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Publication Year
2026
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
423-424
Publisher
IEEE
ISBN (print)
979-8-3195-0588-0
ISBN (electronic)
978-4-9914835-1-6
Event
25th International Conference on Electronics Packaging, held in conjunction with the IEEE EPS Hybrid Bonding Symposium, ICEP-HBS2026 (2026-04-14 - 2026-04-18), Hiroshima, Japan
Page Views
54
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Abstract

This study investigates the corrosion mechanisms at the interfaces of sintered joints exposed to H2S for offshore applications. Through finite element modeling and experimental validation, the galvanic corrosion behavior of four sintered joint configurations was analyzed. Simulation results identified the interface as the primary corrosion zone, with accelerated degradation driven by galvanic coupling. Polarization and electrical conductivity measurements further confirmed that sintered silver maintains corrosion resistance and stable electrical properties after corrosion. This work focused on the interfacial corrosion mechanism and provides insights for offshore power module packages.

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