A CMOS-Compatible Hybrid Plasmonic Slot Waveguide With Enhanced Field Confinement

Journal Article (2016)
Author(s)

Jing Xiao (Guilin University of Electronic Technology)

Qi-qin Wei (Guilin University of Electronic Technology)

Daoguo Yang (Guilin University of Electronic Technology)

Ping Zhang (Guilin University of Electronic Technology)

Ning He (Guilin University of Electronic Technology)

Guo Qi Zhang (TU Delft - Electronic Components, Technology and Materials)

Tianling Ren (Tsinghua University)

XP Chen (Guilin University of Electronic Technology)

Research Group
Electronic Components, Technology and Materials
Copyright
© 2016 Jing Xiao, Qi-Qin Wei, Daoguo Yang, Ping Zhang, Ning He, Kouchi Zhang, Tian-Ling Ren, Xian-Ping Chen
DOI related publication
https://doi.org/10.1109/LED.2016.2531990
More Info
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Publication Year
2016
Language
English
Copyright
© 2016 Jing Xiao, Qi-Qin Wei, Daoguo Yang, Ping Zhang, Ning He, Kouchi Zhang, Tian-Ling Ren, Xian-Ping Chen
Research Group
Electronic Components, Technology and Materials
Issue number
4
Volume number
37
Pages (from-to)
456-458
Reuse Rights

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Abstract

The emerging field of nanophotonics requires plasmonic devices to be fully compatible with semiconductor fabrication techniques. However, very few feasible practical structures exist at present. Here, we propose a CMOS-compatible hybrid plasmonic slot waveguide (HPSW) with enhanced field confinement. Our simulation results show that the HPSW exhibits significantly enhanced field confinement as compared with the traditional low-index slot waveguides and the hybrid metal dielectric slot waveguides. By controlling the thicknesses of different layers, an optimized HPSW structure with a better tradeoff between field confinement and propagation length has been simultaneously achieved.

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