Parasitic effects reduction for wafer-level packaging of RF-MEMS

Iannacci, J; Tian, J.; Sinaga, SM; Gaddi, R; Gnudi, A; Bartek, M.

Parasitic effects reduction for wafer-level packaging of RF-MEMS

Conference paper (2006)

Authors

J Iannacci Old - EWI Ch. Integrated Sensing Devices

J. Tian Old - EWI Ch. Integrated Sensing Devices

SM Sinaga Old - EWI Ch. Integrated Sensing Devices

R Gaddi External organisation

A Gnudi External organisation

M. Bartek Old - EWI Ch. Integrated Sensing Devices

Research Group

Old - EWI Ch. Integrated Sensing Devices

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Published Date

2006

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Research Group

Old - EWI Ch. Integrated Sensing Devices

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