The use of a central beam stop for contrast enhancement in TEM imaging

Journal article (2013)

Authors

C. Zhang

Q. Xu

P.J. Peters QN/Mol. Electronics & Devices ,

H.W. Zandbergen

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Published Date

2013

Language

English

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Abstract

Dark field TEM imaging using a stop of the central beam (DF-000) is reported, It is shown that a strong enhancement in the contrast can be obtained for graphene as example of weak phase object and endocytic multivescilar body as example of an unstained biological sample. No charging or significant contamination of the central beam stop is observed. For graphene, a resolution beyond 1 angstrom(-1) was easily obtained. DF-000 imaging can be considered as a good and easy to use alternative of a phase pla