Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology
Conference Paper
(2014)
Author(s)
S. M. Shakeri (TU Delft - ImPhys/Quantitative Imaging)
B Hulsken (Philips Innovation Services)
L. J. Van Vliet (TU Delft - ImPhys/Quantitative Imaging)
S. Stallinga (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
DOI related publication
https://doi.org/10.1364/FIO.2014.FM4F.5
Final published version
To reference this document use
https://resolver.tudelft.nl/uuid:199d6743-fa60-43d8-ba04-17468f69035c
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Publication Year
2014
Language
English
Research Group
ImPhys/Quantitative Imaging
ISBN (electronic)
1-55752-286-3
Event
Frontiers in Optics 2014, Tuscon Arizona (2014-10-19 - 2014-10-23)
Downloads counter
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Abstract
We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.