Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology
Conference Paper
(2014)
Author(s)
Siavash Shakeri (TU Delft - ImPhys/Quantitative Imaging)
B Hulsken (Philips Innovation Services)
Lucas J Vliet (TU Delft - ImPhys/Quantitative Imaging)
Sjoerd Stallinga (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
DOI related publication
https://doi.org/10.1364/FIO.2014.FM4F.5
To reference this document use:
https://resolver.tudelft.nl/uuid:199d6743-fa60-43d8-ba04-17468f69035c
More Info
expand_more
expand_more
Publication Year
2014
Language
English
Research Group
ImPhys/Quantitative Imaging
ISBN (electronic)
1-55752-286-3
Abstract
We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.
No files available
Metadata only record. There are no files for this record.