Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

Conference paper (2014)

Authors

S.M. Shakeri ImPhys/Quantitative Imaging
B Hulsken Philips Innovation Services
L.J. van Vliet ImPhys/Quantitative Imaging
S. Stallinga ImPhys/Quantitative Imaging
Research Group
ImPhys/Quantitative Imaging
More Info
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Published Date

2014

Language

English

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Research Group

ImPhys/Quantitative Imaging

Abstract

We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.