Reliability analysis of single grain Si TFT using 2D simulation
Conference Paper
(2008)
Author(s)
A Baiano (TU Delft - Electronic Components, Technology and Materials)
J. Tan (TU Delft - Electronic Instrumentation)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:1a4ba3d5-2de9-4e4f-bbd4-62c66ed9703a
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Publication Year
2008
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
109-114
ISBN (print)
978-1-56677-655-4
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