Optical scattering properties of a nano-textured ZnO-silicon interface

Conference paper (2011)

Authors

K. Jager Photovoltaic Materials and Devices -

M Schulte External organisation

K Bittkau External organisation

AM Ermes External organisation

M. Zeman Photovoltaic Materials and Devices -

BE Pieters External organisation

Research Group

Photovoltaic Materials and Devices () (TU Delft)

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http://resolver.tudelft.nl/uuid:1c8288e3-0210-4ec7-a1d9-0a1b07ba270c

Published Date

2011

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Electrical Sustainable Energy

Research Group

Photovoltaic Materials and Devices

Abstract

The scattering properties of transparent conductive oxide (TCO) layers are fundamentally related to the performance of thin film silicon solar cells. In this study we introduce an experimental technique to access light scattering properties at textured TCO-silicon interfaces. Therefore we prepared a sample with a polished microcrystalline silicon layer, which is deposited onto a rough TCO layer. We used the measured results to validate calculations obtained with rigorous diffraction theory, i.e. a numerical solution of Maxwell's equations. Furthermore we evaluated four approximate models based on the scalar scattering theory and ray tracing and compared them to the rigorous diffraction theory.