Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices

Conference Paper (2012)
Author(s)

Y. Wang (TU Delft - Computer Engineering)

S. D. Cotofana (TU Delft - Computer Engineering)

L Fang (External organisation)

Research Group
Computer Engineering
More Info
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-7

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