Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices
Conference Paper
(2012)
Author(s)
Y. Wang (TU Delft - Computer Engineering)
S. D. Cotofana (TU Delft - Computer Engineering)
L Fang (External organisation)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:1c828e5c-3bf2-4ac3-8864-262f25f8d985
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-7
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