Bandwidth analyses for reusing functional interconnect as test access mechanism
Conference Paper
(2008)
Author(s)
A van den Berg (External organisation)
R Ren (External organisation)
E Marinissen (External organisation)
G. Gaydadjiev (TU Delft - Computer Engineering)
K.G.W. Goossens (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:1e570bca-2a53-4cc3-a11e-a38801945b7d
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Publication Year
2008
Research Group
Computer Engineering
Pages (from-to)
21-26
ISBN (print)
978-0-7695-3150-2
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