Bias temperature instability analysis, monitoring and mitigation for nano-scaled circuits
Doctoral Thesis
(2013)
Author(s)
M.S.K. Seyab (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:1e83c96c-8006-453d-a7c0-dda00c3e54d8
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Publication Year
2013
Language
English
Research Group
Computer Engineering
ISBN (print)
978-94-6186-209-9
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