Metric learning by directly minimizing the k-NN training error
Conference Paper
(2012)
Author(s)
VC Dinh (TU Delft - Electrical Engineering, Mathematics and Computer Science)
M Loog (TU Delft - Electrical Engineering, Mathematics and Computer Science)
M Nielsen (External organisation)
Research Group
Pattern Recognition and Bioinformatics
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https://resolver.tudelft.nl/uuid:2356d2df-f7ad-415d-8ae9-d5c0547645eb
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Publication Year
2012
Language
English
Research Group
Pattern Recognition and Bioinformatics
Pages (from-to)
1265-1268
Publisher
Springer
ISBN (print)
978-4-9906441-1-6
Event
ICPR 2012 (2012-11-11 - 2012-11-15), Berlin, Germany
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