Thermally induced delamination-buckling in a copper-ceramic microelectronic product
Conference Paper
(2001)
Author(s)
CJ Liu (External organisation)
G.Q. Zhang (External organisation)
L.J. Ernst (TU Delft - Dynamics of Micro and Nano Systems)
G Wisse (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
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Publication Year
2001
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
75-82
ISBN (print)
0-7803-9806-8
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