High quality factor RF inductors using low loss conductor featured with skin effect suppression for standard CMOS/BiCMOS
Conference Paper
(2011)
Author(s)
I Iramnaaz (External organisation)
T Sandoval (External organisation)
Y Zhuang (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
H. Schellevis (TU Delft - Electronic Components, Technology and Materials)
B Rejaei (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
DOI related publication
https://doi.org/10.1109/ECTC.2011.5898508
To reference this document use:
https://resolver.tudelft.nl/uuid:256edbb0-d391-436e-b6a2-907d107cc1af
More Info
expand_more
expand_more
Publication Year
2011
Language
English
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
163-168
ISBN (print)
978-1-61284-497-8
No files available
Metadata only record. There are no files for this record.