High quality factor RF inductors using low loss conductor featured with skin effect suppression for standard CMOS/BiCMOS

Conference Paper (2011)
Author(s)

I Iramnaaz (External organisation)

T Sandoval (External organisation)

Y Zhuang (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

H. Schellevis (TU Delft - Electronic Components, Technology and Materials)

B Rejaei (External organisation)

Research Group
Old - EWI Ch. Integrated Sensing Devices
DOI related publication
https://doi.org/10.1109/ECTC.2011.5898508
More Info
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Publication Year
2011
Language
English
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
163-168
ISBN (print)
978-1-61284-497-8

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