Susceptibility Study of TES Micro‑calorimeters for X‑ray Spectroscopy Under FDM Readout

Journal Article (2022)
Authors

Davide Vaccaro (SRON–Netherlands Institute for Space Research)

H. Akamatsu (SRON–Netherlands Institute for Space Research)

L Gottardi (SRON–Netherlands Institute for Space Research)

J. van der Kuur (SRON–Netherlands Institute for Space Research)

Emanuele Taralli (SRON–Netherlands Institute for Space Research)

M. De Wit (SRON–Netherlands Institute for Space Research)

MP Bruijn (SRON–Netherlands Institute for Space Research)

R den Hartog (SRON–Netherlands Institute for Space Research)

J. R. Gao (SRON–Netherlands Institute for Space Research, ImPhys/Optics)

G.B. More authors (External organisation)

Research Group
ImPhys/Optics
Copyright
© 2022 D. Vaccaro, H. Akamatsu, L Gottardi, J. Van Der Kuur, E. Taralli, M. de Wit, MP Bruijn, R den Hartog, J.R. Gao, More Authors
To reference this document use:
https://doi.org/10.1007/s10909-022-02850-5
More Info
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Publication Year
2022
Language
English
Copyright
© 2022 D. Vaccaro, H. Akamatsu, L Gottardi, J. Van Der Kuur, E. Taralli, M. de Wit, MP Bruijn, R den Hartog, J.R. Gao, More Authors
Research Group
ImPhys/Optics
Issue number
3-4
Volume number
209
Pages (from-to)
562-569
DOI:
https://doi.org/10.1007/s10909-022-02850-5
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Abstract

We present a characterization of the sensitivity of TES X-ray micro-calorimeters to environmental conditions under frequency-domain multiplexing (FDM) readout. In the FDM scheme, each TES in a readout chain is in series with a LC band-pass filter and AC biased with an independent carrier at MHz range. Using TES arrays, cold readout circuitry and warm electronics fabricated at SRON and SQUIDs produced at VTT Finland, we characterize the sensitivity of the detectors to bias voltage, bath temperature and magnetic field. We compare our results with the requirements for the Athena X-IFU instrument, showing the compliance of the measured sensitivities. We find in particular that FDM is intrinsically insensitive to the magnetic fieldbecause of TES design and AC readout.

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