Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

Huang, J.; Golubovi¿, DS; Koh, Sau; Yang, Di; Li, X.; Fan, X; Zhang, Guogi

Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

Journal article (2015)

Authors

J. Huang Electronic Components, Technology and Materials

DS Golubovi¿ External organisation

Sau Koh Electronic Components, Technology and Materials

Di Yang External organisation

X. Li External organisation

X Fan External organisation

Guogi Zhang Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2015

Language

English

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Research Group

Electronic Components, Technology and Materials

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