X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector
Book Chapter
(1999)
Author(s)
J Sonsky (TU Delft - Old organisation Stralingstechnologie)
J Huizenga (TU Delft - Old organisation Stralingstechnologie)
C.W.E. van Eijk (TU Delft - Old organisation Stralingstechnologie)
Pasqualina M. Sarro (TU Delft - Electronic Components, Technology and Materials)
Department
Old organisation Stralingstechnologie
To reference this document use:
https://resolver.tudelft.nl/uuid:282a62b5-3659-474a-8281-1126caf3dc1f
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Publication Year
1999
Department
Old organisation Stralingstechnologie
Pages (from-to)
24-24
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