Electron wave front modulation with patterned mirrors
M.A.R. Krielaart (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)
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Abstract
We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.