Electron wave front modulation with patterned mirrors

Doctoral thesis (2021)

Authors

M.A.R. Krielaart ImPhys/Microscopy Instrumentation & Techniques - AS
Research Group
ImPhys/Microscopy Instrumentation & Techniques (AS) (TU Delft)
Copyright: © 2021 M.A.R. Krielaart
DOI
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https://doi.org/10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7
Electron microscopy Wave front modulation Electron mirror Aberration correction Electron beam separator
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Published Date

15-03-2021

Language

English

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Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Microscopy Instrumentation & Techniques

Abstract

We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.

Files

Dissertation.pdf
(.pdf | 22.1 Mb)