Influence of trap states on dynamic properties of single grain silicon thin film transistors
Journal Article
(2006)
Author(s)
F Yan (External organisation)
P Migliorato (External organisation)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:28657df6-d5db-4d4d-ba83-f98a745bcb0b
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Publication Year
2006
Research Group
Electronic Components, Technology and Materials
Volume number
88
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