On the Impact of Radiation Losses in TRL Calibrations

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On the Impact of Radiation Losses in TRL Calibrations

Conference Paper (2018)

Author(s)

M. Spirito (TU Delft - Electrical Engineering, Mathematics and Computer Science)

C. De Martino (TU Delft - Electrical Engineering, Mathematics and Computer Science)

L. Galatro (Vertigo Technologies, TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group

Electronics

Dispersion Surface waves On-wafer calibration (sub)mm-wave Multimode propagation

DOI related publication

https://doi.org/10.1109/ARFTG.2018.8423820 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:2dc61d56-f30d-46a4-a5bb-34ea1a7a5d05

More Info

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Publication Year

2018

Language

English

Research Group

Electronics

Article number

8423820

ISBN (print)

978-1-5386-5451-4

ISBN (electronic)

978-1-5386-5450-7

Event

ARFTG 2018: 91st ARFTG Microwave Measurement Conference (2018-06-15 - 2018-06-15), Philadelphia, United States

Downloads counter

204

Abstract

In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.