On the Impact of Radiation Losses in TRL Calibrations

Conference paper (2018)

Authors

M. Spirito Electronics - EEMCS
C. De Martino Electronics - EEMCS
L. Galatro Vertigo Technologies, Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
Dispersion Surface waves On-wafer calibration (sub)mm-wave Multimode propagation
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Published Date

2018

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics

Abstract

In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.

Files

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(.pdf | 1.32 Mb)