A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

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A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Conference Paper (2016)

Author(s)

Gianluca Furano (European Space Agency (ESA))

Stefano Di Mascio (University of Rome Tor Vergata)

Tomasz Szewczyk (European Space Agency (ESA))

Alessandra Menicucci (TU Delft - Space Systems Egineering)

Luigi Campajola (Università degli Studi di Napoli Federico II)

Francesco Di Capua (Università degli Studi di Napoli Federico II)

Andrea Fabbri (University of Roma Tre)

Marco Ottavi (University of Rome Tor Vergata)

DOI related publication

https://doi.org/10.1109/DFT.2016.7684084 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:2f70831e-ff29-4ae0-b33b-bcf4c7a7afd0

More Info

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Publication Year

2016

Language

English

Article number

7684084

Pages (from-to)

131-134

ISBN (electronic)

9781509036233

Event

29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 (2016-09-19 - 2016-09-20), Storrs, United States

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212

Abstract

This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.