A test mechanism for device diagnostics and process characterization
Conference Paper
(2007)
Author(s)
LA Rocha (TU Delft - Electronic Instrumentation)
L Mol (TU Delft - Electronic Instrumentation)
E Cretu (External organisation)
Reinoud Wolfenbuttel (TU Delft - Electronic Instrumentation)
J Machado da silva (External organisation)
J.S. matos (External organisation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:30b6f5bc-fa42-4d53-9351-af0c77a006c8
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Publication Year
2007
Research Group
Electronic Instrumentation
Pages (from-to)
597-602
ISBN (print)
978 84690 8629 2
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