Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

S. W.H. Eijt (TU Delft - RST/Fundamental Aspects of Materials and Energy)

R Kind (External organisation)

S Singh (TU Delft - RST/Fundamental Aspects of Materials and Energy)

H. Schut (TU Delft - RST/Neutron and Positron Methods in Materials)

W.J. Legerstee (TU Delft - RST/Fundamental Aspects of Materials and Energy)

RWA Hendrikx (External organisation)

V Svetchnikov (QN/High Resolution Electron Microscopy)

RJ Westerwaal (External organisation)

B. Dam (TU Delft - ChemE/Materials for Energy Conversion and Storage)