Characterization of pure boron depositions integrated in silicon diodes for nanometer deep junction applications

Doctoral thesis (2010)

Authors

F Sarubbi Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2010

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials