AI-Empowered 3D X-Ray Analysis of Solder Joint Fatigue After Board Level Vibration Testing
A. G. Ghezeljehmeidan (TU Delft - Electronic Components, Technology and Materials)
V. Thukral (NXP Semiconductors)
F. Xu (NXP Semiconductors)
W. D. Van Driel (TU Delft - Electronic Components, Technology and Materials)
More Info
expand_more
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
Mission-critical electronic systems demand early and accurate detection of solder joint degradation to ensure reliability. Quad Flat No-Lead (QFN) packages, widely used in automotive and industrial applications, are especially prone to vibration-induced solder fatigue. However, traditional failure analysis methods (e.g., dye-and-pry, cross-sectioning, manual Xray inspection) are labor-intensive and often insufficient to detect early-stage cracks. This paper presents an automated inspection framework that combines high-resolution 3D X-ray tomography with a YOLOv11-based deep learning model to detect and segment vibration-induced cracks in QFN solder joints. The pipeline achieves precise localization of cracks in volumetric data, discriminates them from voids, and extracts morphological descriptors through parametric fitting. By statistically correlating these image-derived crack features with electrical resistance measurements recorded in situ during vibration tests, we establish a direct link between physical crack evolution and functional degradation of the joint. The results demonstrate that our AI-driven method can automatically identify tiny solder cracks and reliably offer predict impending interconnect failures in comparable granularity of traditional inspection techniques, surpassing them in speed. This approach offers a powerful prognostic health monitoring tool for electronic packaging, and it is extensible to other package types and stress conditions.
Files
File under embargo until 24-08-2026