Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation.

M Leoni (External organisation)

U Welzel (External organisation)

P Lampartner (External organisation)

EJ Mittemeijer (TU Delft - OLD Virtual Materials and Mechanics)

J-D Kamminga (TU Delft - OLD Metals Processing, Microstructures and Properties)