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U Welzel
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2 records found
Stress in Thin Layers; Grain interaction, Elastic constants and diffraction response.
Journal article -
J. Kamminga
,
M Leoni
,
U Welzel
,
P Lamparter
,
EJ Mittemeijer
Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation.
Journal article -
M Leoni
,
U Welzel
,
P Lampartner
,
EJ Mittemeijer
,
J. Kamminga