Badwidth analysis of functional interconnects used as test access mechanism
Journal Article
(2010)
Author(s)
A van den Berg (External organisation)
P Ren (External organisation)
E Marinissen (External organisation)
G. Gaydadjiev (TU Delft - Computer Engineering)
K.G.W. Goossens (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:34e3f47a-f106-4104-b33f-fbf8938169af
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Publication Year
2010
Language
English
Research Group
Computer Engineering
Issue number
4
Volume number
26
Pages (from-to)
453-464
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