Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method
Journal Article
(2015)
Authors
M Cai (External organisation)
D Yang (External organisation)
K Tian (External organisation)
P Zhang (External organisation)
X Chen (External organisation)
L Liu (External organisation)
Guo-Qi Zhang (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://doi.org/10.1016/j.microrel.2015.06.147
TU Delft Repository resolver:
https://resolver.tudelft.nl/35ba443a-c364-4533-9580-f6a6165ad68d
More Info
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Publication Year
2015
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
9-10
Volume number
55
Pages (from-to)
1784-1789
DOI:
https://doi.org/10.1016/j.microrel.2015.06.147
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