X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower
Conference Paper
(2011)
Author(s)
Y Chen (TU Delft - Electronic Instrumentation)
J. Tan (TU Delft - Electronic Instrumentation)
Xintang Wang (External organisation)
AJ Mierop (External organisation)
A.J.P.A.M. Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/ESSDERC.2011.6044211
To reference this document use:
https://resolver.tudelft.nl/uuid:35be0e8b-499a-472f-9110-9fba8d989b36
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Publication Year
2011
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
155-158
ISBN (print)
978-1-4577-0706-3
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