A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

Journal article (2000)

Authors

J. Kamminga OLD Metals Processing, Microstructures and Properties
R. Delhez OLD Virtual Materials and Mechanics
Th.H de Keijser External organisation
EJ Mittemeijer OLD Virtual Materials and Mechanics
Research Group
OLD Metals Processing, Microstructures and Properties
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Published Date

2000

Language

Undefined/Unknown

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Research Group

OLD Metals Processing, Microstructures and Properties