A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.
Journal Article
(2000)
Author(s)
J-D Kamminga (TU Delft - OLD Metals Processing, Microstructures and Properties)
R Delhez (TU Delft - OLD Virtual Materials and Mechanics)
Th.H de Keijser (External organisation)
EJ Mittemeijer (TU Delft - OLD Virtual Materials and Mechanics)
Research Group
OLD Metals Processing, Microstructures and Properties
To reference this document use:
https://resolver.tudelft.nl/uuid:374d6113-f765-4fdd-9287-b48ae6397a0b
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Publication Year
2000
Research Group
OLD Metals Processing, Microstructures and Properties
Volume number
33
Pages (from-to)
108-111
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