New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

On the origin of stress in magnetron sputtered TiN layers.

Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids.

A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

Diffraction-line Broadening Analysis of Dislocation Configurations.

Highly supersaturated, highly sputtered Ag-Co and Ag-Ni layers.

Relaxation of internal stresses in chemically vapour deposited TiN/TiB2 double layers.

A model for stress in thin layers induced by misfitting particles. An origin for growth stress.

Stress and stress gradients in magnetron sputtered TiN layers.

Note on relaxation of cooling induced strains in two-phase AlSi-alloys at room temperature

Precipitation in liquid-quenched Al-Mg alloys; a study by use of X-ray diffraction line shift and line broadening

On misfit-induced lattice spacing variations in two-phase-alloys: the case of cooling-induced microstrains in the Al-matrix of fully aged AlSi alloys

Kinetics of precipitation and of relaxation of precipitation-induced stresses in aluminium-silicon alloys

Misfit strains and excess vacancies in liquid-quenched and solid-quenched AlSi alloys on aging

Excess vacancies in rapidly quenched aluminium alloys

Consolidation and resulting tensile strength of melt-spun AlMg and AlSi alloys

Rapidly solidified (melt-spun) aluminium alloys: morphology, texture and excess vacancies

On precipitation in rapidly solidified aluminium-silicon alloys

Structural inhomogenaties of AlSi alloys rapidly quenched from the melt