Ion-implantation generated nanovoids in Si and MgO monitored by high resolution positron beam analysis
Conference Paper
(2001)
Author(s)
S. W H Eijt (TU Delft - Old - Section Defects in Materials)
CV Falub (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
PE Mijnarends (TU Delft - Old - Section Defects in Materials)
MA van Huis (TU Delft - Old - Interfaculty Reactor Institute)
AV Fedorov (TU Delft - Old - Section Defects in Materials)
Research Group
Old - Section Defects in Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:3969a96c-1015-4de7-9ed3-55db7e811586
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Publication Year
2001
Research Group
Old - Section Defects in Materials
Pages (from-to)
O14.11.1-O14.11.6
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