Av

A van Veen

264 records found

Authored

The positron annihilation 2D-ACAR technique in materials science

Lid Editorial Advisory Board van Defect and Diffusion Forum, Scitec Publications
Other (1998) - A van Veen

Lid Scientific Organizing Committee
Other (1998) - A van Veen

Lid International Advisory Committee on Low-Energy Positron Annihilation
Other (1998) - A van Veen

Lid jury STW
Other (1998) - A van Veen

Thermal desorption of deuterium from Be, and Be with helium bubbles
Conference paper (1998) - AV Fedorov, A van Veen, GJ Busker

Monte Carlo program MODEX: simulation of point defect clustering during irradiation and subsequent annealing
Journal article (1998) - AV Fedorov, A van Veen

Voorzitter IOOC/IRI
Other (1998) - A van Veen

Two-detector Doppler broadening study of enhancement in Al
Journal article (1998) - P.E. Mijnarends, AC Kruseman, A van Veen, H. Schut, A Bansil

Referee voor Nucl. Instr. B.
Other (1998) - A van Veen

The thermal evaluation of nanocavities in helium and deuterium implanted MgO single crystals

Hydrogen behaviour in interstitial-free steel during pickling and hydrogen effects on blowholes
Conference paper (1998) - O Dankert, A van Veen, R van Meenen, JP Zijp, AA Kamperman

Positrons: looking at materials in a different way
Abstract (1998) - A van Veen

Positronen, een krachtige sonde voor nano-holten in materialen
Abstract (1998) - A van Veen

Positron beam technique for the study of defects at the Si/SiO2 interface of a polysillicon gated MOS system
Conference paper (1997) - M Clement, JMM de Nijs, H. Schut, A van Veen, P Balk

Transport of positrons in an electrically biased MOS system
Journal article (1997) - M Clement, JMM de Nijs, H. Schut, A van Veen, P Balk

Positron annihilation as a tool for the study of defects in the MOS system
Journal article (1997) - JMM de Nijs, M Clement, H. Schut, A van Veen

Characterization of defects at the Si/SiO2 interface of a polysilicon-gated MOS system by monoenergetic positrons
Journal article (1997) - M Clement, JMM de Nijs, H. Schut, A van Veen

Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system

Analysis of positron beam data by combined use of the shape and wing parameters
Journal article (1996) - M Clement, JMM de Nijs, A van Veen, H. Schut, P Balk