Surface morphologies of excimer-laser annealed BF2+ implanted Si diodes
Journal Article
(2004)
Authors
A Bourtsev (TU Delft - Electronic Components, Technology and Materials)
H Schut (Old - Section Defects in Materials)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
A van Veen (Old - Section Defects in Materials)
J Slabbekoorn (TU Delft - Electronic Components, Technology and Materials)
T.L.M. Scholtes (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/0c5ab930-88ef-4b19-8f16-969e98a56bb1
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Publication Year
2004
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
109-113
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